Innovative technologies are the key to tackling some of society’s key challenges – and many of these technologies have an optical system at their core. Examples include semiconductor lithography systems designed to create ever-smaller and more energy-efficient microchips, satellite-based high-resolution earth observation systems, and basic research in the field of gravitational-wave detection. In the realm of optics, however, even the tiniest imperfections can lead to scattered light, which causes a reduction in contrast and a lower light yield. Today’s optical systems therefore rely on optimized design and comprehensive inspection of the complete surface of optical components. To achieve this, the Fraunhofer Institute for Applied Optics and Precision
Engineering IOF is developing light scattering measurement techniques that can detect unwanted scattered light.